Contour Measuring Instrument CMI-Z60R

Model: CMI-Z60R

Producer: Metrology-Taiwan

Giá: Contact

Profile measurement: The measuring principle of this device is a rectangular coordinate measurement method, through X-axis, Z-axis sensors, mapping the surface contour coordinate point of the part to be tested, transmitting ...

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Dimensions: horizontal distance, vertical distance, linear distance, radius and diameter
Angle: horizontal and vertical angle, angle
Position tolerance: parallelism and perpendicularity
Shape tolerances: straightness, pyramidal, arc
Subsystem: sub-point, sub-line, sub-circle
Roughness: Ra, Rp, Rv, Rz, Rz (jis), R3z, RzDIN, Rzj, Rmax, Re, Rt, Rq, Rsk, Rku, Rsm, Rs, Rq, Rk, Rpk, Rvk, Mr1, Mr2, Rmr
Wavelength: Wa, Wt, Wp, Wv, Wz, Wq, Wsm, Wsk, Wku, Wmr
Profile measurement parameters: Pa, Pt, Pp, Pv, Pz, Pq, Psm, Psk, Pku, Pmr

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Technical specifications

Standard accessories

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